MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP probe systems provide a complete 150 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.
MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.
LANTIME M200: NTP Server in 1U Case for Server Rackmount
LANTIME M300: NTP Server in 1U Case for Server Rackmount with GPS as reference.
Network forensics appliance dedicated to security investigations.
LANTIME M200: NTP Server in 1U Case for Server Rackmount with GPS as reference.
LANTIME M300: NTP Server in 1U Case for Server Rackmount with the DCF77 time code transmitter as reference
LANTIME M600: High EndNTP Server in 1U Case for Server Rackmount
LANTIME M600/mrs/3GE: High EndNTP Server in 1U Case for Server Rackmount
The MPI TS300-ShielDEnvironment™ (TS300-SE) is designed to ensure advanced EMI/RFI/light-tight shielding, ultra-low noise, low leakage measurement capabilities on 300 mm wafer in a temperature range from -60 to +300°C.
In addition, it can be configured with light curtain safety system as TS300-HP for dedicated High-Power measurements up to 10 kV / 600 A or with MPI IceFreeEnvironment™ to become a probe station for Design Validation (Product Engineering) supporting long customized probe card up 15” length and probing with MicroPositioners (active impedance probes) simultaneously.
It’s incorporated with vibration isolation table at optimal height to make the daily operation very convenient.
